The μ of a given species under equilibrium conditions is equal in

The μ of a given species under equilibrium conditions is equal in all phases that are in contact [22]. Therefore, we can obtain (3) In addition, ABT-888 cell line C Mg is limited by the formation of Mg3N2 to substitute Mg for Ga or Al as an acceptor [10]. This limitation meets the relation

(4) By substituting Selleck THZ1 Equations 3 and 4 into Equation 2, we can obtain (5) which, aside from ΔE, depends only on μ N , since the μ AlN/GaN and are constants [25]. μ N should be limited between μ N (Al/Ga-rich) ≤ μ N  ≤ μ N (N-rich) [11], namely, , to drive the source materials to form Al x Ga1 – x N alloys instead of the undesirable phases (bulk Ga, Al, and N2). Our calculated ΔHGaN value of -1.01 eV is higher than the ΔHAlN value of -2.97 eV, which are consistent with the experimental values of -1.08 and -3.13 eV [25]. Therefore, as the growth condition varies from Ga-rich to N-rich conditions, μ N changes from MGCD0103 ic50 to . Thus, ΔH f varies over a range corresponding to 1/3ΔH GaN of 0.337 eV, as shown in Figure 2a. This variation

indicates that the N-rich growth atmosphere favor the Mg incorporation effectively in AlGaN. Generally, the N-rich condition is modulated by increasing the V/III ratio. However, for a fixed III flow, the Al x Ga1 – x N growth has an optimal V/III ratio for the best crystal quality [13–16]. Nonetheless, the max flow limitation of the MOVPE system does not allow the V flow to be increased infinitely. Accounting for these limitations, an inspiration can be obtained from Figure 1c, in which the protecting atmosphere with NH3 flow just provides an ultimate V/III ratio condition (extremely N-rich) for C Mg enhancement when the epitaxy ends with the III flow becoming zero. Simultaneously,

the stopped growth avoids the formation of low-quality Al x Ga1 – x N crystal. If this special condition 17-DMAG (Alvespimycin) HCl is introduced as an intentional interruption during the continuous p-Al x Ga1 – x N growth, then the overall Mg incorporation could be improved. Figure 2 Formation enthalpy difference of Mg Ga /Mg Al and C Mg profile of Al 0.49 Ga 0.51 N film. (a) Formation enthalpy difference of MgGa and MgAl between Ga-rich and N-rich condition. (b) C Mg profile of Al0.49Ga0.51N film with three different Cp2Mg flows grown by the MSE technique. The inset in (b) illustrates the source supply sequence of the MSE technique, an ultimate V/III ratio condition is shortly produced during the interruption. To validate this hypothesis, a growth interruption experiment was designed, as shown schematically in the inset of Figure 2b. We closed the metal flows (TMAl, TMGa, and Cp2Mg flows) three times. In these three periods (35 nm thick), different Cp2Mg flows (0.45, 0.81, and 0.99 nmol/min) were applied to investigate the interruption effect systematically. Figure 2b shows the SIMS C Mg profile of Al0.49Ga0.51N film across three periods.

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